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secondary ion mass spectrometry
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English
Wikipedia
has an article on:
secondary ion mass spectrometry
Wikipedia
secondary
ion
mass
spectrometry
(
uncountable
)
(Abbreviated as
SIMS
)
(
physics
)
A
technique
used to
visualize
the
three-dimensional
structure
of solids by employing an
energetic
ion
beam
to
fragment
the
atomic
or
molecular
constituents from a surface
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